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- W2155493036 abstract "A study of the optical spectra in alloys of a-Si1-xGex: H in the energy range 0.5 to 10 eV is presented. The absorption spectra and the reflectivity are measured for films with 0 ≦ x ≦ 1 and the imaginary part of the dielectric function, ϵ2(ω), is calculated by Kramers-Kronig analysis. The spectra are discussed by considering the bonding structure of the films and the behavior is compared with that of other amorphous alloys (a-Si1-xCx : H, a-Si1-xNx: H). Whereas in the latter alloys the optical properties are determined by the SiSi bonds up to x ≈ 0.5 the contribution of the various bonds to ϵ2(ω) cannot be separated in a Si/Ge:H due to the fact that in this case the bond strengths of the SiSi, SiGe, and GeGe bonds are very similar.In amorphen Filmen aus a-Si1-xGex: H werden die optischen Spektren im Energiebereich 0.5 bis 10 eV studiert. Fur 0 ≦ x ≦ 1 werden die Absorptionsspektren durch photothermische Deflektionsspektroskopie und optische Transmission sowie das Reflexionsvermogen gemessen. Der Imaginarteil der dielektrischen Funktion, ϵ2(ω) wird aus den Reflexionsspektren durch Kramers-Kronig-Analyse berechnet. Zur Diskussion der Spektren wird die Bindungsstruktur der Filme herangezogen, und das Verhalten wird mit dem anderer amorpher Legierungen (a-Si1-xCx: H, a-Si1-xNx: H) verglichen. Wahrend bei diesen Legierungen das optische Verhalten bis zu x ≈ 0,5 durch die Si-Si-Bindungen bestimmt ist, kann im Falle der a-Si/Ge: H-Legierungen der Beitrag der einzelnen Bindungen nicht separiert werden. Ursache dafur ist, das die Bindungsstarken der beteiligten SiSi-, SiGe- und GeGe-Bindungen vergleichbar sind." @default.
- W2155493036 created "2016-06-24" @default.
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- W2155493036 date "1994-12-01" @default.
- W2155493036 modified "2023-09-26" @default.
- W2155493036 title "Optical Properties and Structure of a-Si1-xGex:H Films" @default.
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- W2155493036 doi "https://doi.org/10.1002/pssb.2221860211" @default.
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