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• W2155694037 abstract "A novel test pattern generation method for asynchronous circuits is described and evaluated in detail. The method combines conventional pattern generation with hazard-free state initialization. Any type of asynchronous circuit can be processed, and all stuck-at faults, even those inside state-holding elements, such as C-elements, are considered. The results on some of the largest benchmarks ever used for asynchronous circuit testing show fault coverage on the order of 99% with no area overhead for (quasi-)delay-insensitive datapath circuits." @default.
• W2155694037 created "2016-06-24" @default.
• W2155694037 creator A5039317978 @default.
• W2155694037 date "2010-04-01" @default.
• W2155694037 modified "2023-09-27" @default.
• W2155694037 title "Initialization-Based Test Pattern Generation for Asynchronous Circuits" @default.
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• W2155694037 doi "https://doi.org/10.1109/tvlsi.2009.2013470" @default.
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