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- W2155936784 abstract "As semiconductor manufacturing technology advances, power dissipation and noise in scan testing have become critical problems. Our studies on practical LSI manufacturing show that power supply voltage drop causes testing problems during shift operations in scan testing. In this paper, we present a new testing method named MD-SCAN (multi duty-scan) which solves power supply voltage drop problems, as well as its experimental results applied to practical LSI chips." @default.
- W2155936784 created "2016-06-24" @default.
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- W2155936784 date "2003-06-26" @default.
- W2155936784 modified "2023-10-11" @default.
- W2155936784 title "MD-SCAN method for low power scan testing" @default.
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- W2155936784 doi "https://doi.org/10.1109/ats.2002.1181690" @default.
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