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• W2156789636 abstract "We measure the dephasing time of ground-state excitonic transitions in InGaAs quantum dots under electrical injection in the temperature range from 10 to 70 K. Electrical injection into the barrier region results in a pure dephasing of the excitonic transitions. Once the injected carriers fill the electronic ground state, the biexciton to exciton transition is probed and a correlation of the exciton and biexciton phonon scattering mechanisms is found. Additional filling of the excited states creates multiexcitons that show a fast dephasing due to population relaxation." @default.
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• W2156789636 date "2002-10-10" @default.
• W2156789636 modified "2023-10-02" @default.
• W2156789636 title "Relaxation and Dephasing of Multiexcitons in Semiconductor Quantum Dots" @default.
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• W2156789636 doi "https://doi.org/10.1103/physrevlett.89.187401" @default.
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