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- W2156801727 abstract "Abstract An empirical electrical equivalent circuit for dielectric thin films, based on experimental data, is developed. Current responses to voltage-steps and to voltage-ramps are calculated and compared with experimental data. The simulation allows us to separate current contributions of different physical processes while the experiment only reveals the sum of the currents." @default.
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- W2156801727 date "1995-05-01" @default.
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- W2156801727 title "How to analyse relaxation and leakage currents of dielectric thin films: Simulation of voltage-step and voltage-ramp techniques" @default.
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- W2156801727 doi "https://doi.org/10.1080/10584589508219666" @default.
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