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- W2157583194 abstract "Process scaling and the need for smaller SRAM cells challenges process technologies to make millions of robust and reliable bitline contacts on a single chip. Another challenge is to identify marginal, resistive and unreliable bitline contacts given the inherent electrical characteristics of the SRAM cell. This paper describes two design techniques that improve the screenability and stressability of bitline contacts in high-density SRAMs. These techniques are developed to overcome the lack of detectability of resistive bitline contacts in SRAM cells." @default.
- W2157583194 created "2016-06-24" @default.
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- W2157583194 date "2002-11-13" @default.
- W2157583194 modified "2023-09-27" @default.
- W2157583194 title "Bitline contacts in high density SRAMs: design for testability and stressability" @default.
- W2157583194 cites W1798884210 @default.
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- W2157583194 doi "https://doi.org/10.1109/test.2001.966699" @default.
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