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- W2157832088 abstract "Presents an approach for the detection of multiple stuck-open (SOP) and stuck-on (SON) faults in CMOS combinational logic circuits. It is proved that multiple SON and SOP faults do not mask each other. This is achieved using a behavioral analysis in which the maskable fault patterns are proved to be impossible. New testing approaches are proposed. Testing is implemented using a combination of two-pattern test sequences as well as universal test sets, as proposed in previous papers by different authors. >" @default.
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- W2157832088 date "2003-01-02" @default.
- W2157832088 modified "2023-09-26" @default.
- W2157832088 title "Detection of multiple faults in CMOS circuits using a behavioral approach" @default.
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- W2157832088 doi "https://doi.org/10.1109/vtest.1992.232747" @default.
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