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- W2158067323 abstract "Digital and analog ICs generally rely on the concept of matched behavior between identically designed devices. Time-independent variations between identically designed transistors, called mismatch, affect the performance of most analog and even digital MOS circuits. This article focuses on the analysis of mismatch in MOS transistors resulting from random fluctuations of the dopant concentration, first studied by Keyes. Today, we recognize these fluctuations as the main cause of mismatch in bulk CMOS transistors." @default.
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- W2158067323 date "2006-01-01" @default.
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- W2158067323 title "MOSFET mismatch modeling: a new approach" @default.
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- W2158067323 doi "https://doi.org/10.1109/mdt.2006.20" @default.
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