Matches in SemOpenAlex for { <https://semopenalex.org/work/W2158283685> ?p ?o ?g. }
Showing items 1 to 97 of
97
with 100 items per page.
- W2158283685 endingPage "278" @default.
- W2158283685 startingPage "274" @default.
- W2158283685 abstract "Abstract The development of integration type pixel detectors presents interest for physics communities because it brings optimization of design, simplicity of production—which means smaller cost, and reduction of detector material budget. During the last decade a lot of research and development activities took place in the field of CMOS Silicon-On-Insulator (SOI) technology resulting in improvement in wafer size, wafer resistivity and MIM capacitance. Several ideas have been tested successfully and are gradually entering into the application phase. Some of the novel concepts exploring SOI technology are pursued at KEK; several prototypes of dual mode integration type pixel (DIPIX) have been recently produced and described. This report presents initial test results of some of the prototypes including tests obtained with the infrared laser beams and Americium (Am-241) source. The Equivalent Noise Charge (ENC) of 86 e − has been measured. The measured performance demonstrates that SOI technology is a feasible choice for future applications." @default.
- W2158283685 created "2016-06-24" @default.
- W2158283685 creator A5001280642 @default.
- W2158283685 creator A5012340694 @default.
- W2158283685 creator A5016887865 @default.
- W2158283685 creator A5041578269 @default.
- W2158283685 creator A5080892394 @default.
- W2158283685 creator A5084632649 @default.
- W2158283685 date "2013-08-01" @default.
- W2158283685 modified "2023-10-01" @default.
- W2158283685 title "Measurement results of DIPIX pixel sensor developed in SOI technology" @default.
- W2158283685 cites W2025712175 @default.
- W2158283685 cites W2084810119 @default.
- W2158283685 cites W2088826977 @default.
- W2158283685 cites W2544114300 @default.
- W2158283685 cites W2545445907 @default.
- W2158283685 doi "https://doi.org/10.1016/j.nima.2012.10.099" @default.
- W2158283685 hasPublicationYear "2013" @default.
- W2158283685 type Work @default.
- W2158283685 sameAs 2158283685 @default.
- W2158283685 citedByCount "10" @default.
- W2158283685 countsByYear W21582836852013 @default.
- W2158283685 countsByYear W21582836852014 @default.
- W2158283685 countsByYear W21582836852015 @default.
- W2158283685 countsByYear W21582836852017 @default.
- W2158283685 countsByYear W21582836852018 @default.
- W2158283685 crossrefType "journal-article" @default.
- W2158283685 hasAuthorship W2158283685A5001280642 @default.
- W2158283685 hasAuthorship W2158283685A5012340694 @default.
- W2158283685 hasAuthorship W2158283685A5016887865 @default.
- W2158283685 hasAuthorship W2158283685A5041578269 @default.
- W2158283685 hasAuthorship W2158283685A5080892394 @default.
- W2158283685 hasAuthorship W2158283685A5084632649 @default.
- W2158283685 hasConcept C119599485 @default.
- W2158283685 hasConcept C120665830 @default.
- W2158283685 hasConcept C121332964 @default.
- W2158283685 hasConcept C127413603 @default.
- W2158283685 hasConcept C160633673 @default.
- W2158283685 hasConcept C160671074 @default.
- W2158283685 hasConcept C17525397 @default.
- W2158283685 hasConcept C192562407 @default.
- W2158283685 hasConcept C24326235 @default.
- W2158283685 hasConcept C30066665 @default.
- W2158283685 hasConcept C41008148 @default.
- W2158283685 hasConcept C46362747 @default.
- W2158283685 hasConcept C49040817 @default.
- W2158283685 hasConcept C53143962 @default.
- W2158283685 hasConcept C544956773 @default.
- W2158283685 hasConcept C62520636 @default.
- W2158283685 hasConcept C94915269 @default.
- W2158283685 hasConceptScore W2158283685C119599485 @default.
- W2158283685 hasConceptScore W2158283685C120665830 @default.
- W2158283685 hasConceptScore W2158283685C121332964 @default.
- W2158283685 hasConceptScore W2158283685C127413603 @default.
- W2158283685 hasConceptScore W2158283685C160633673 @default.
- W2158283685 hasConceptScore W2158283685C160671074 @default.
- W2158283685 hasConceptScore W2158283685C17525397 @default.
- W2158283685 hasConceptScore W2158283685C192562407 @default.
- W2158283685 hasConceptScore W2158283685C24326235 @default.
- W2158283685 hasConceptScore W2158283685C30066665 @default.
- W2158283685 hasConceptScore W2158283685C41008148 @default.
- W2158283685 hasConceptScore W2158283685C46362747 @default.
- W2158283685 hasConceptScore W2158283685C49040817 @default.
- W2158283685 hasConceptScore W2158283685C53143962 @default.
- W2158283685 hasConceptScore W2158283685C544956773 @default.
- W2158283685 hasConceptScore W2158283685C62520636 @default.
- W2158283685 hasConceptScore W2158283685C94915269 @default.
- W2158283685 hasLocation W21582836851 @default.
- W2158283685 hasOpenAccess W2158283685 @default.
- W2158283685 hasPrimaryLocation W21582836851 @default.
- W2158283685 hasRelatedWork W1542318876 @default.
- W2158283685 hasRelatedWork W1994096881 @default.
- W2158283685 hasRelatedWork W1997096915 @default.
- W2158283685 hasRelatedWork W2012418282 @default.
- W2158283685 hasRelatedWork W2021250761 @default.
- W2158283685 hasRelatedWork W2025712175 @default.
- W2158283685 hasRelatedWork W2029390141 @default.
- W2158283685 hasRelatedWork W2064612801 @default.
- W2158283685 hasRelatedWork W2072744166 @default.
- W2158283685 hasRelatedWork W2097771446 @default.
- W2158283685 hasRelatedWork W2112567085 @default.
- W2158283685 hasRelatedWork W2120108264 @default.
- W2158283685 hasRelatedWork W2132673215 @default.
- W2158283685 hasRelatedWork W2137986281 @default.
- W2158283685 hasRelatedWork W2143372468 @default.
- W2158283685 hasRelatedWork W2398310034 @default.
- W2158283685 hasRelatedWork W3043220219 @default.
- W2158283685 hasRelatedWork W3105105870 @default.
- W2158283685 hasRelatedWork W761909281 @default.
- W2158283685 hasRelatedWork W2466893276 @default.
- W2158283685 hasVolume "718" @default.
- W2158283685 isParatext "false" @default.
- W2158283685 isRetracted "false" @default.
- W2158283685 magId "2158283685" @default.
- W2158283685 workType "article" @default.