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- W2158436161 abstract "The paper presents a RD disturb model study of STT-MTJ memory bits. It shows that high-current short-pulsed RD may cause failure under hammer conditions. Analytical models for such have been developed and validated against numerical simulations." @default.
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- W2158436161 date "2010-06-01" @default.
- W2158436161 modified "2023-09-24" @default.
- W2158436161 title "Modeling and analysis of read (RD) disturb in 1T-1STT MTJ memory bits" @default.
- W2158436161 doi "https://doi.org/10.1109/drc.2010.5551946" @default.
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