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- W2159441010 abstract "The hot-carrier-injected oxide regions in the front and back interfaces are systematically clarified for fully depleted surface-channel nMOSFET's and surface-channel and buried-channel pMOSFET's on SOI, which is essential to understand hot carrier reliability. The influence of these injected carriers on the front-channel properties is investigated. A new hot-carrier degradation mode peculiar to MOSFET's on SOI is described. This mode is caused by suppression of parasitic bipolar action due to hot-carrier-induced front interface traps. The reliability lifetime of nMOS and pMOSFET's is also discussed, considering the new degradation mode." @default.
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- W2159441010 date "1995-06-01" @default.
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- W2159441010 title "Reliability of ultra-thin SOI MOSFET's" @default.
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- W2159441010 doi "https://doi.org/10.1016/0167-9317(95)00079-n" @default.
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