Matches in SemOpenAlex for { <https://semopenalex.org/work/W2159675689> ?p ?o ?g. }
- W2159675689 endingPage "2238" @default.
- W2159675689 startingPage "2231" @default.
- W2159675689 abstract "We report the combined effects of irradiation and bias temperature stress (BTS) on MOS capacitors with HfO/sub 2/ dielectrics. Irradiation is found to enhance BTS-induced degradation in these devices; significant differences in the amounts of enhancement are observed for different irradiation biases. Zero-bias or positive-bias irradiation followed by negative BTS (NBTS) leads to much worse degradation than either irradiation or NBTS alone. This is primarily due to the formation of dipoles during irradiation and the electrostatic repulsion of electrons from the oxide during NBTS. In an integrated circuit application, the worst-case response for these gate stacks will be pMOS transistors irradiated in their off states, and annealed in their on states. The effects of irradiation and BTS are also reported for Al/sub 2/O/sub 3/-based MOS capacitors with Al gates and SiO/sub 2/-based MOS capacitors with NiSi gates for comparison with HfO/sub 2/. Somewhat less sensitivity to combined irradiation and BTS is observed for the Al/sub 2/O/sub 3/-based devices, and significantly less sensitivity to combined effects is observed for the thermal oxides with NiSi gates." @default.
- W2159675689 created "2016-06-24" @default.
- W2159675689 creator A5006017484 @default.
- W2159675689 creator A5026279636 @default.
- W2159675689 creator A5034452027 @default.
- W2159675689 creator A5049822123 @default.
- W2159675689 creator A5075909473 @default.
- W2159675689 date "2005-12-01" @default.
- W2159675689 modified "2023-10-17" @default.
- W2159675689 title "Bias-temperature instabilities and radiation effects in MOS devices" @default.
- W2159675689 cites W1548138892 @default.
- W2159675689 cites W1626161525 @default.
- W2159675689 cites W1970483274 @default.
- W2159675689 cites W1972289215 @default.
- W2159675689 cites W1972949192 @default.
- W2159675689 cites W1983254605 @default.
- W2159675689 cites W1989606734 @default.
- W2159675689 cites W1995940513 @default.
- W2159675689 cites W1998804339 @default.
- W2159675689 cites W2007661130 @default.
- W2159675689 cites W2012364451 @default.
- W2159675689 cites W2029013246 @default.
- W2159675689 cites W2040255185 @default.
- W2159675689 cites W2041424982 @default.
- W2159675689 cites W2049935257 @default.
- W2159675689 cites W2050493779 @default.
- W2159675689 cites W2051400932 @default.
- W2159675689 cites W2054857078 @default.
- W2159675689 cites W2060598846 @default.
- W2159675689 cites W2068036292 @default.
- W2159675689 cites W2069362588 @default.
- W2159675689 cites W2069429054 @default.
- W2159675689 cites W2078713657 @default.
- W2159675689 cites W2087450899 @default.
- W2159675689 cites W2090745963 @default.
- W2159675689 cites W2098184705 @default.
- W2159675689 cites W2100683809 @default.
- W2159675689 cites W2103139200 @default.
- W2159675689 cites W2104036887 @default.
- W2159675689 cites W2109258263 @default.
- W2159675689 cites W2114949709 @default.
- W2159675689 cites W2115044607 @default.
- W2159675689 cites W2122322008 @default.
- W2159675689 cites W2123883877 @default.
- W2159675689 cites W2137759443 @default.
- W2159675689 cites W2138558164 @default.
- W2159675689 cites W2138787284 @default.
- W2159675689 cites W2146422883 @default.
- W2159675689 cites W2147080351 @default.
- W2159675689 cites W2151512997 @default.
- W2159675689 cites W2159670966 @default.
- W2159675689 cites W2160319990 @default.
- W2159675689 cites W2169435281 @default.
- W2159675689 doi "https://doi.org/10.1109/tns.2005.860667" @default.
- W2159675689 hasPublicationYear "2005" @default.
- W2159675689 type Work @default.
- W2159675689 sameAs 2159675689 @default.
- W2159675689 citedByCount "78" @default.
- W2159675689 countsByYear W21596756892012 @default.
- W2159675689 countsByYear W21596756892013 @default.
- W2159675689 countsByYear W21596756892014 @default.
- W2159675689 countsByYear W21596756892015 @default.
- W2159675689 countsByYear W21596756892016 @default.
- W2159675689 countsByYear W21596756892017 @default.
- W2159675689 countsByYear W21596756892018 @default.
- W2159675689 countsByYear W21596756892019 @default.
- W2159675689 countsByYear W21596756892020 @default.
- W2159675689 countsByYear W21596756892021 @default.
- W2159675689 countsByYear W21596756892022 @default.
- W2159675689 countsByYear W21596756892023 @default.
- W2159675689 crossrefType "journal-article" @default.
- W2159675689 hasAuthorship W2159675689A5006017484 @default.
- W2159675689 hasAuthorship W2159675689A5026279636 @default.
- W2159675689 hasAuthorship W2159675689A5034452027 @default.
- W2159675689 hasAuthorship W2159675689A5049822123 @default.
- W2159675689 hasAuthorship W2159675689A5075909473 @default.
- W2159675689 hasConcept C111337013 @default.
- W2159675689 hasConcept C119599485 @default.
- W2159675689 hasConcept C121332964 @default.
- W2159675689 hasConcept C127413603 @default.
- W2159675689 hasConcept C133386390 @default.
- W2159675689 hasConcept C165801399 @default.
- W2159675689 hasConcept C172385210 @default.
- W2159675689 hasConcept C185544564 @default.
- W2159675689 hasConcept C192562407 @default.
- W2159675689 hasConcept C195370968 @default.
- W2159675689 hasConcept C27050352 @default.
- W2159675689 hasConcept C2779679103 @default.
- W2159675689 hasConcept C49040817 @default.
- W2159675689 hasConcept C52192207 @default.
- W2159675689 hasConcept C557185 @default.
- W2159675689 hasConceptScore W2159675689C111337013 @default.
- W2159675689 hasConceptScore W2159675689C119599485 @default.
- W2159675689 hasConceptScore W2159675689C121332964 @default.
- W2159675689 hasConceptScore W2159675689C127413603 @default.
- W2159675689 hasConceptScore W2159675689C133386390 @default.
- W2159675689 hasConceptScore W2159675689C165801399 @default.
- W2159675689 hasConceptScore W2159675689C172385210 @default.