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- W2160358952 abstract "A microwave technique was used to determine the electron drift velocity in an ion-implanted GaAs MESFET with a 0.5*100- mu m gate. The characteristics of the velocity versus drain-to-source voltage for a GaAs MESFET exhibit a peak velocity of 4.0, 3.3, and 2.2*10/sup 7/ cm/s at 100%, 65%, and 31% of I/sub dss/, respectively. This work presents the first experimental determination of electron drift velocity at various gate biases and provides verification for velocity overshoot in ion-implanted GaAs MESFETs.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W2160358952 date "1991-02-01" @default.
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- W2160358952 title "An experimental determination of electron drift velocity in 0.5- mu m gate-length ion-implanted GaAs MESFET's" @default.
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- W2160358952 doi "https://doi.org/10.1109/55.75697" @default.
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