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- W2160603150 abstract "Automatic test pattern generation (ATPG) is recommended in order to obtain high test coverage quickly. For failure analysis, some standard ATPG tools offer in addition a feature to perform fault diagnosis on full scan designs. Software fault localization techniques become increasingly important in future designs, since in highly complex VHDL programmed designs, a standard analysis using functional test vectors is expendable and time consuming. This paper describes all steps necessary for project set-up and a flow for fault diagnosis. In order to minimize the list of possible failures (given by the tool) and to determine the physical location of the defect (x,y,z), a failure localization flow is presented. Initial results on ICs with both failures purposely induced by focused ion beam and real production failures represents an excellent starting point for further fault localization." @default.
- W2160603150 created "2016-06-24" @default.
- W2160603150 creator A5013214327 @default.
- W2160603150 creator A5024898734 @default.
- W2160603150 date "2002-11-13" @default.
- W2160603150 modified "2023-09-24" @default.
- W2160603150 title "Software aided failure analysis using ATPG tool" @default.
- W2160603150 cites W3116648946 @default.
- W2160603150 doi "https://doi.org/10.1109/ipfa.2001.941488" @default.
- W2160603150 hasPublicationYear "2002" @default.
- W2160603150 type Work @default.
- W2160603150 sameAs 2160603150 @default.
- W2160603150 citedByCount "9" @default.
- W2160603150 countsByYear W21606031502014 @default.
- W2160603150 countsByYear W21606031502019 @default.
- W2160603150 countsByYear W21606031502021 @default.
- W2160603150 crossrefType "proceedings-article" @default.
- W2160603150 hasAuthorship W2160603150A5013214327 @default.
- W2160603150 hasAuthorship W2160603150A5024898734 @default.
- W2160603150 hasConcept C119599485 @default.
- W2160603150 hasConcept C127413603 @default.
- W2160603150 hasConcept C134146338 @default.
- W2160603150 hasConcept C17626397 @default.
- W2160603150 hasConcept C200601418 @default.
- W2160603150 hasConcept C41008148 @default.
- W2160603150 hasConceptScore W2160603150C119599485 @default.
- W2160603150 hasConceptScore W2160603150C127413603 @default.
- W2160603150 hasConceptScore W2160603150C134146338 @default.
- W2160603150 hasConceptScore W2160603150C17626397 @default.
- W2160603150 hasConceptScore W2160603150C200601418 @default.
- W2160603150 hasConceptScore W2160603150C41008148 @default.
- W2160603150 hasLocation W21606031501 @default.
- W2160603150 hasOpenAccess W2160603150 @default.
- W2160603150 hasPrimaryLocation W21606031501 @default.
- W2160603150 hasRelatedWork W1888890915 @default.
- W2160603150 hasRelatedWork W2038612712 @default.
- W2160603150 hasRelatedWork W2062753030 @default.
- W2160603150 hasRelatedWork W2104696797 @default.
- W2160603150 hasRelatedWork W2104719885 @default.
- W2160603150 hasRelatedWork W2121207248 @default.
- W2160603150 hasRelatedWork W2138549077 @default.
- W2160603150 hasRelatedWork W2152174221 @default.
- W2160603150 hasRelatedWork W2163312307 @default.
- W2160603150 hasRelatedWork W2621207760 @default.
- W2160603150 isParatext "false" @default.
- W2160603150 isRetracted "false" @default.
- W2160603150 magId "2160603150" @default.
- W2160603150 workType "article" @default.