Matches in SemOpenAlex for { <https://semopenalex.org/work/W2160994299> ?p ?o ?g. }
Showing items 1 to 57 of
57
with 100 items per page.
- W2160994299 abstract "Testing for IC pin leakage current is important because it detects many subtle I/O circuitry faults. A technique is introduced in which the leakage current of pins is tested (or measured) during wafer probing using existing 1149.1 boundary scan access only - the tested pins are not contacted The technique requires every tested pad to have a tristate driver and receiver (I/O wrap), and relies on knowing approximately each pad's capacitance and each receiver's switching point voltage. Experimental results for a 500 signal-pin IC, that also contained an embedded test for the logic, show that the test program is simplified and runs on a very low cost tester in a reduced test time, while overall yield is maintained or improved." @default.
- W2160994299 created "2016-06-24" @default.
- W2160994299 creator A5016252672 @default.
- W2160994299 creator A5047733204 @default.
- W2160994299 creator A5063906167 @default.
- W2160994299 date "2002-11-13" @default.
- W2160994299 modified "2023-09-25" @default.
- W2160994299 title "Contactless digital testing of IC pin leakage currents" @default.
- W2160994299 cites W1930127001 @default.
- W2160994299 cites W1991035950 @default.
- W2160994299 cites W2071661549 @default.
- W2160994299 cites W2099724478 @default.
- W2160994299 cites W2166053532 @default.
- W2160994299 doi "https://doi.org/10.1109/test.2001.966635" @default.
- W2160994299 hasPublicationYear "2002" @default.
- W2160994299 type Work @default.
- W2160994299 sameAs 2160994299 @default.
- W2160994299 citedByCount "23" @default.
- W2160994299 countsByYear W21609942992012 @default.
- W2160994299 countsByYear W21609942992013 @default.
- W2160994299 countsByYear W21609942992014 @default.
- W2160994299 countsByYear W21609942992016 @default.
- W2160994299 crossrefType "proceedings-article" @default.
- W2160994299 hasAuthorship W2160994299A5016252672 @default.
- W2160994299 hasAuthorship W2160994299A5047733204 @default.
- W2160994299 hasAuthorship W2160994299A5063906167 @default.
- W2160994299 hasConcept C119599485 @default.
- W2160994299 hasConcept C127413603 @default.
- W2160994299 hasConcept C139719470 @default.
- W2160994299 hasConcept C162324750 @default.
- W2160994299 hasConcept C192562407 @default.
- W2160994299 hasConcept C2777042071 @default.
- W2160994299 hasConcept C41008148 @default.
- W2160994299 hasConceptScore W2160994299C119599485 @default.
- W2160994299 hasConceptScore W2160994299C127413603 @default.
- W2160994299 hasConceptScore W2160994299C139719470 @default.
- W2160994299 hasConceptScore W2160994299C162324750 @default.
- W2160994299 hasConceptScore W2160994299C192562407 @default.
- W2160994299 hasConceptScore W2160994299C2777042071 @default.
- W2160994299 hasConceptScore W2160994299C41008148 @default.
- W2160994299 hasLocation W21609942991 @default.
- W2160994299 hasOpenAccess W2160994299 @default.
- W2160994299 hasPrimaryLocation W21609942991 @default.
- W2160994299 hasRelatedWork W1559297545 @default.
- W2160994299 hasRelatedWork W1576596122 @default.
- W2160994299 hasRelatedWork W2113351124 @default.
- W2160994299 hasRelatedWork W2163493537 @default.
- W2160994299 hasRelatedWork W2378028528 @default.
- W2160994299 hasRelatedWork W2748952813 @default.
- W2160994299 hasRelatedWork W2899084033 @default.
- W2160994299 hasRelatedWork W3038594250 @default.
- W2160994299 hasRelatedWork W4200546562 @default.
- W2160994299 hasRelatedWork W2741367898 @default.
- W2160994299 isParatext "false" @default.
- W2160994299 isRetracted "false" @default.
- W2160994299 magId "2160994299" @default.
- W2160994299 workType "article" @default.