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- W2161670316 abstract "To model nonlinear device behavior at microwave frequencies, accurate large-signal models are required. However, the standard procedure to estimate model parameters is often cumbersome, as it involves several measurement systems (DC, vector network analyzer, etc.). Therefore, we propose a new nonlinear modeling technique, which reduces the complexity of the model generation tremendously and only requires full two-port vectorial large-signal measurements. This paper reports on the results obtained with this new modeling technique applied to both empirical and artificial-neural-network device models. Experimental results are given for high electron-mobility transistors and MOSFETs. We also show that realistic signal excitations can easily be included in the optimization process." @default.
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- W2161670316 date "2002-10-01" @default.
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- W2161670316 title "Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements" @default.
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- W2161670316 doi "https://doi.org/10.1109/tmtt.2002.803427" @default.
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