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• W2163397997 abstract "Significance Exposure to high-energy X-rays, experienced during X-ray diffraction experiments for determining atomic structures, can potentially create large local electric fields from photoelectron ejection. Under cryogenic conditions, these fields may persist indefinitely. Mapping of electric fields is important for a complete understanding of damage mechanisms involved in X-ray measurements, for potential effects on the quality and interpretation of X-ray data, and for possible direct impact on diffraction resolution through the piezoelectric effect. Mapping of electric fields may also be useful in retaining a record of locations of X-ray exposure. In this paper, electric-field induced second harmonic generation imaging is explored in simulation and experiment. It provides insight into the position and distribution of local electric fields within an X-ray exposed sample." @default.
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• W2163397997 date "2014-12-31" @default.
• W2163397997 modified "2023-09-28" @default.
• W2163397997 title "Imaging local electric fields produced upon synchrotron X-ray exposure" @default.
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• W2163397997 doi "https://doi.org/10.1073/pnas.1407771112" @default.
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