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• W2164420009 abstract "The channel hot-carrier (CHC) degradation of submicron p-and nMOST's is studied using Random Telegraph Signal (RTS) and low frequency (lf) noise. As will be demonstrated, the changes observed in the RTS fractional amplitude ?I D /I D are similar as the changes in the drain current I D , i.e., for pMOST's an increase is observed after CHC stress, while a reduction is observed for nMOST's. These observations are discussed in view of existing models for hot-carrier degradation. Finally, the correlation between the RTS behaviour and the If noise will be examined briefly." @default.
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• W2164420009 date "1992-09-01" @default.
• W2164420009 modified "2023-10-04" @default.
• W2164420009 title "Random telegraph signal noise: A probe for hot-carrier degradation effects in submicrometer MOSFET's?" @default.
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• W2164420009 doi "https://doi.org/10.1016/0167-9317(92)90506-m" @default.
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