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W2165688412 abstract "<para xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> Magnetic, micromagnetic, and texture properties of the martensitic thin films prepared by magnetron sputtering of Ni<formula formulatype=inline> <tex Notation=TeX>$_{49.5}$</tex></formula>Mn<formula formulatype=inline> <tex Notation=TeX>$_{28}$</tex></formula>Ga<formula formulatype=inline> <tex Notation=TeX>$_{22.5 }$</tex></formula> target on MgO(100) wafer are studied as a function of film thickness. The films exhibit 220-fiber texture. Moreover, in contrast to thick films, a considerable in-plane texture component is giving rise to the pronounced in-plane magnetic anisotropy found in the thin film. The texture features together with a large magnetocrystalline anisotropy lead to the particular domain structure and different magnetic anisotropy components of films depending on the film thickness and substrate nature. </para>" @default.
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W2165688412 date "2008-11-01" @default.
W2165688412 modified "2023-10-18" @default.
W2165688412 title "MFM Domain Imaging of Textured Ni-Mn-Ga/MgO(100) Thin Films" @default.
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W2165688412 doi "https://doi.org/10.1109/tmag.2008.2001652" @default.
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