FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2166235576> ?p ?o ?g. }

• W2166235576 endingPage "170" @default.
• W2166235576 startingPage "159" @default.
• W2166235576 abstract "When producing engineered surfaces, the stochastic portion of the processing greatly affects the overall output quality. We propose a Gaussian process model that accounts for the impact of control variables on the stochastic elements of the produced surfaces. An optimization algorithm is outlined to find the maximum likelihood estimates of the model parameters. A case study involving the thickness surfaces of semiconductor wafers is examined that demonstrates the need for the proposed approach. Copyright © 2013 John Wiley & Sons Ltd" @default.
• W2166235576 created "2016-06-24" @default.
• W2166235576 creator A5015629734 @default.
• W2166235576 creator A5022416209 @default.
• W2166235576 creator A5085868833 @default.
• W2166235576 creator A5086680431 @default.
• W2166235576 date "2013-08-12" @default.
• W2166235576 modified "2023-10-14" @default.
• W2166235576 title "Gaussian process modeling for engineered surfaces with applications to Si wafer production" @default.
• W2166235576 cites W1599710294 @default.
• W2166235576 cites W1978629053 @default.
• W2166235576 cites W1996007769 @default.
• W2166235576 cites W1999975842 @default.
• W2166235576 cites W2002205599 @default.
• W2166235576 cites W2016676747 @default.
• W2166235576 cites W2024697317 @default.
• W2166235576 cites W2030774493 @default.
• W2166235576 cites W2046176699 @default.
• W2166235576 cites W2046386534 @default.
• W2166235576 cites W2050851101 @default.
• W2166235576 cites W2067570972 @default.
• W2166235576 cites W2081972090 @default.
• W2166235576 cites W2088502517 @default.
• W2166235576 cites W2095008834 @default.
• W2166235576 cites W2103239205 @default.
• W2166235576 cites W2128503116 @default.
• W2166235576 cites W2155613718 @default.
• W2166235576 cites W2567948266 @default.
• W2166235576 cites W2801490189 @default.
• W2166235576 cites W326632916 @default.
• W2166235576 cites W4233595378 @default.
• W2166235576 cites W4241897277 @default.
• W2166235576 cites W4249753629 @default.
• W2166235576 cites W4254115559 @default.
• W2166235576 cites W61851564 @default.
• W2166235576 doi "https://doi.org/10.1002/sta4.26" @default.
• W2166235576 hasPublicationYear "2013" @default.
• W2166235576 type Work @default.
• W2166235576 sameAs 2166235576 @default.
• W2166235576 citedByCount "10" @default.
• W2166235576 countsByYear W21662355762015 @default.
• W2166235576 countsByYear W21662355762016 @default.
• W2166235576 countsByYear W21662355762017 @default.
• W2166235576 countsByYear W21662355762018 @default.
• W2166235576 countsByYear W21662355762020 @default.
• W2166235576 countsByYear W21662355762021 @default.
• W2166235576 countsByYear W21662355762022 @default.
• W2166235576 countsByYear W21662355762023 @default.
• W2166235576 crossrefType "journal-article" @default.
• W2166235576 hasAuthorship W2166235576A5015629734 @default.
• W2166235576 hasAuthorship W2166235576A5022416209 @default.
• W2166235576 hasAuthorship W2166235576A5085868833 @default.
• W2166235576 hasAuthorship W2166235576A5086680431 @default.
• W2166235576 hasConcept C105795698 @default.
• W2166235576 hasConcept C111919701 @default.
• W2166235576 hasConcept C113644684 @default.
• W2166235576 hasConcept C121332964 @default.
• W2166235576 hasConcept C126255220 @default.
• W2166235576 hasConcept C127413603 @default.
• W2166235576 hasConcept C127491075 @default.
• W2166235576 hasConcept C160671074 @default.
• W2166235576 hasConcept C163716315 @default.
• W2166235576 hasConcept C171250308 @default.
• W2166235576 hasConcept C192562407 @default.
• W2166235576 hasConcept C21880701 @default.
• W2166235576 hasConcept C2779530757 @default.
• W2166235576 hasConcept C33923547 @default.
• W2166235576 hasConcept C41008148 @default.
• W2166235576 hasConcept C61326573 @default.
• W2166235576 hasConcept C62520636 @default.
• W2166235576 hasConcept C8272713 @default.
• W2166235576 hasConcept C98045186 @default.
• W2166235576 hasConceptScore W2166235576C105795698 @default.
• W2166235576 hasConceptScore W2166235576C111919701 @default.
• W2166235576 hasConceptScore W2166235576C113644684 @default.
• W2166235576 hasConceptScore W2166235576C121332964 @default.
• W2166235576 hasConceptScore W2166235576C126255220 @default.
• W2166235576 hasConceptScore W2166235576C127413603 @default.
• W2166235576 hasConceptScore W2166235576C127491075 @default.
• W2166235576 hasConceptScore W2166235576C160671074 @default.
• W2166235576 hasConceptScore W2166235576C163716315 @default.
• W2166235576 hasConceptScore W2166235576C171250308 @default.
• W2166235576 hasConceptScore W2166235576C192562407 @default.
• W2166235576 hasConceptScore W2166235576C21880701 @default.
• W2166235576 hasConceptScore W2166235576C2779530757 @default.
• W2166235576 hasConceptScore W2166235576C33923547 @default.
• W2166235576 hasConceptScore W2166235576C41008148 @default.
• W2166235576 hasConceptScore W2166235576C61326573 @default.
• W2166235576 hasConceptScore W2166235576C62520636 @default.
• W2166235576 hasConceptScore W2166235576C8272713 @default.
• W2166235576 hasConceptScore W2166235576C98045186 @default.
• W2166235576 hasIssue "1" @default.
• W2166235576 hasLocation W21662355761 @default.
• W2166235576 hasOpenAccess W2166235576 @default.
• W2166235576 hasPrimaryLocation W21662355761 @default.
• W2166235576 hasRelatedWork W1995427843 @default.
• W2166235576 hasRelatedWork W1996323220 @default.
• W2166235576 hasRelatedWork W2026456043 @default.

• next