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- W2166632225 abstract "In this paper, the methodology of the reliability modeling and simulation for the state-of-the-art technology is presented. The extraction for HCI (Hot Carrier Injection) and NBTI (Negative Bias Temperature Instability) for both lifetime and aged model parameter method is discussed. The integration of these models into the transistor level and gate level simulation flow can be used by the designers to satisfy the reliability requirements." @default.
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- W2166632225 date "2004-07-20" @default.
- W2166632225 modified "2023-09-26" @default.
- W2166632225 title "Build-in reliability analysis for circuit design in the nanometer technology era" @default.
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- W2166632225 doi "https://doi.org/10.1109/icicdt.2004.1309946" @default.
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