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- W2167814612 abstract "Abstract— Fatigue crack growth tests of silicon nitride Si3N4 were carried out under four-point bending using square bar specimens at room temperature. A pre-crack was introduced by a bridge indentation method. Decreasing K-type tests at stress ratios of R= 0.1 and 0.6 and also under static load were first carried out, and after observing the cessation of crack growth, K-increasing tests were performed except for the case of a static load. Crack closure was observed on most specimens by the elastic compliance method. Furthermore, SEM observations of the crack paths were made to see what was happening during crack growth. The threshold and the region of steady crack growth were observed more clearly under cyclic loading, and an effect of load cycling certainly existed which became more evident when the maximum stress intensity factor Kmax approached the threshold. A wedge effect, caused by fine fragments on the crack surface, played an important role in crack closure behaviour of each specimen, and it is suggested that the crack growth rate is controlled by both the effective stress intensity range ΔKeff and the effective mean stress intensity factor Km,eff at least as a first approximation." @default.
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- W2167814612 date "1992-07-01" @default.
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- W2167814612 title "FATIGUE CRACK GROWTH OF SILICON NITRIDE WITH CRACK WEDGING BY FINE FRAGMENTS" @default.
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- W2167814612 doi "https://doi.org/10.1111/j.1460-2695.1992.tb01303.x" @default.
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