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• W2168748939 abstract "This work presents a methodology to identify integrated circuit yield detractors using SRAM functional test results in combination with a defect-bitmap dictionary. We investigate the accuracy of the defect classification under different forms of voltage testing and current testing. In particular we investigate the benefit of using multiple Iddq current levels calibrated to remove normal parametric variations. We also investigate the effects of unmodeled defects and the ability to identify cases off certain and uncertain diagnosis. We have experimentally validated our approach using a production microprocessor cache." @default.
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• W2168748939 date "2002-12-23" @default.
• W2168748939 modified "2023-09-22" @default.
• W2168748939 title "Improvement of SRAM-based failure analysis using calibrated Iddq testing" @default.
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• W2168748939 doi "https://doi.org/10.1109/vtest.1996.510847" @default.
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