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• W2168992600 abstract "We study the properties of a single gate oxide trap subjected to AC Bias Temperature Instability (BTI) stress conditions by means of Time Dependent Defect Spectroscopy. A theory for predicting the occupancy of a single trap after AC stress is developed based on first order kinetics and verified on experimental data. The developed theory can be used to develop circuit simulators and predict time dependent variability." @default.
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• W2168992600 date "2011-04-01" @default.
• W2168992600 modified "2023-10-02" @default.
• W2168992600 title "Response of a single trap to AC negative Bias Temperature stress" @default.
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• W2168992600 doi "https://doi.org/10.1109/irps.2011.5784501" @default.
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