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- W2169610953 abstract "We utilize low-frequency noise measurements to examine the sub-threshold voltage (sub-V <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>TH</sub> ) operation of highly scaled devices. We find that the sub-V <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>TH</sub> low-frequency noise is dominated by random telegraph noise (RTN). The RTN is exacerbated both by channel dimension scaling and reducing the gate overdrive into the sub-V <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>TH</sub> regime. These large RTN fluctuations greatly impact circuit variability and represent a troubling obstacle that must be solved if sub-V <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>TH</sub> operation is to become a viable solution for low-power applications." @default.
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- W2169610953 date "2009-05-01" @default.
- W2169610953 modified "2023-10-16" @default.
- W2169610953 title "Large random telegraph noise in sub-threshold operation of nano-scale nMOSFETs" @default.
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- W2169610953 doi "https://doi.org/10.1109/icicdt.2009.5166255" @default.
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