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• W2170006257 abstract "CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> caped La <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> Zr <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>7</sub> (LZO) buffer layers on cube-textured Ni5W substrates were fabricated by the method of chemical solution deposition(CSD). The orientation of both LZO film and CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> /LZO buffer layer was investigated using conventional XRD and X-ray four circle diffractometers, respectively. The results reveal that both the LZO film on Ni5W substrates and CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> film on LZO buffer layer are grown epitaxially. The value of Full Width at Half Maximum (FWHM) of (111) Phi scan of CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> /LZO buffer layer is around 8 <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>deg</sup> , and the FWHM of (200) omega-scan of CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> /La <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> Zr <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>7</sub> buffer layer is 6.5 <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>deg</sup> , indicating a good in-plan orientation of the as obtained buffer layers. It was observed by the high resolution SEM that the surface of LZO buffer layer is crack-free and very dense. The surface result observed by AFM indicates a very smooth CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> surface with 5.9 nm of the root mean square roughness measured in an areas of 30 times 30 mum <sup xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sup> . AES depth profile results of CeO <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>2</sub> /LZO buffer layers shows that the deposited LZO film could effectively prevent the diffusion of Ni into the buffer layer." @default.
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• W2170006257 date "2009-06-01" @default.
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• W2170006257 title "Preparation of ${rm CeO}_{2}/{rm La}_{2}{rm Zr}_{2}{rm O}_{7}$ Buffer Layers on Textured Ni5W Substrates by Chemical Solution Deposition Method" @default.
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• W2170006257 doi "https://doi.org/10.1109/tasc.2009.2018208" @default.
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