Matches in SemOpenAlex for { <https://semopenalex.org/work/W2170550282> ?p ?o ?g. }
- W2170550282 endingPage "1276" @default.
- W2170550282 startingPage "1269" @default.
- W2170550282 abstract "The interaction between the hot carrier (HC) induced pMOSFET's degradation and the Fowler-Nordheim (FN) injection is investigated. It has been found that the FN injection is an efficient method to recover pMOSFET's from the HC induced degradation. This is achieved by removing some of the trapped electrons from the oxide and forming positive charges along the channel. The relative importance of these two factors is determined. The contribution of the interface states created by FN injection is negligible, since they are acceptor-like and not charged during pMOSFET's operation. The positive charges increase the lifetime of a recovered pMOSFET by requiring more electron trapping to compensate their effects on the threshold voltage. They also enhance the magnitude of punchthrough voltage. The effects of FN injection on the HC trapping kinetics are discussed. Under our experimental conditions, the new trapping sites created by FN injection are negligible, compared with the as-grown traps. When a recovered pMOSFET is stressed again, its degradation rate is not higher than that of a fresh pMOSFET. This allows FN injection to be used repeatedly and we can therefore control the pMOSFET's degradation within a given range.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
- W2170550282 created "2016-06-24" @default.
- W2170550282 creator A5036637389 @default.
- W2170550282 creator A5038743336 @default.
- W2170550282 date "1995-07-01" @default.
- W2170550282 modified "2023-10-02" @default.
- W2170550282 title "Effects of high field injection on the hot carrier induced degradation of submicrometer pMOSFET's" @default.
- W2170550282 cites W1979006344 @default.
- W2170550282 cites W1981964536 @default.
- W2170550282 cites W1989564545 @default.
- W2170550282 cites W1998781562 @default.
- W2170550282 cites W2000806993 @default.
- W2170550282 cites W2010419066 @default.
- W2170550282 cites W2013956639 @default.
- W2170550282 cites W2018501318 @default.
- W2170550282 cites W2021750186 @default.
- W2170550282 cites W2026201816 @default.
- W2170550282 cites W2038322334 @default.
- W2170550282 cites W2040602574 @default.
- W2170550282 cites W2042479941 @default.
- W2170550282 cites W2048793855 @default.
- W2170550282 cites W2053663438 @default.
- W2170550282 cites W2053889244 @default.
- W2170550282 cites W2055388298 @default.
- W2170550282 cites W2069266144 @default.
- W2170550282 cites W2081048183 @default.
- W2170550282 cites W2091638764 @default.
- W2170550282 cites W2098838255 @default.
- W2170550282 cites W2123281480 @default.
- W2170550282 cites W2128946500 @default.
- W2170550282 cites W2152491361 @default.
- W2170550282 cites W2157036277 @default.
- W2170550282 cites W2160444745 @default.
- W2170550282 cites W2163894605 @default.
- W2170550282 cites W2164422767 @default.
- W2170550282 cites W2165290466 @default.
- W2170550282 cites W2166125626 @default.
- W2170550282 cites W2537371532 @default.
- W2170550282 doi "https://doi.org/10.1109/16.391209" @default.
- W2170550282 hasPublicationYear "1995" @default.
- W2170550282 type Work @default.
- W2170550282 sameAs 2170550282 @default.
- W2170550282 citedByCount "19" @default.
- W2170550282 countsByYear W21705502822012 @default.
- W2170550282 countsByYear W21705502822013 @default.
- W2170550282 countsByYear W21705502822014 @default.
- W2170550282 countsByYear W21705502822016 @default.
- W2170550282 countsByYear W21705502822017 @default.
- W2170550282 countsByYear W21705502822021 @default.
- W2170550282 crossrefType "journal-article" @default.
- W2170550282 hasAuthorship W2170550282A5036637389 @default.
- W2170550282 hasAuthorship W2170550282A5038743336 @default.
- W2170550282 hasConcept C119599485 @default.
- W2170550282 hasConcept C121332964 @default.
- W2170550282 hasConcept C127413603 @default.
- W2170550282 hasConcept C147120987 @default.
- W2170550282 hasConcept C165801399 @default.
- W2170550282 hasConcept C172385210 @default.
- W2170550282 hasConcept C185592680 @default.
- W2170550282 hasConcept C18903297 @default.
- W2170550282 hasConcept C192562407 @default.
- W2170550282 hasConcept C26873012 @default.
- W2170550282 hasConcept C2777924906 @default.
- W2170550282 hasConcept C2778413303 @default.
- W2170550282 hasConcept C2779679103 @default.
- W2170550282 hasConcept C2779892579 @default.
- W2170550282 hasConcept C49040817 @default.
- W2170550282 hasConcept C62520636 @default.
- W2170550282 hasConcept C73500089 @default.
- W2170550282 hasConcept C86803240 @default.
- W2170550282 hasConceptScore W2170550282C119599485 @default.
- W2170550282 hasConceptScore W2170550282C121332964 @default.
- W2170550282 hasConceptScore W2170550282C127413603 @default.
- W2170550282 hasConceptScore W2170550282C147120987 @default.
- W2170550282 hasConceptScore W2170550282C165801399 @default.
- W2170550282 hasConceptScore W2170550282C172385210 @default.
- W2170550282 hasConceptScore W2170550282C185592680 @default.
- W2170550282 hasConceptScore W2170550282C18903297 @default.
- W2170550282 hasConceptScore W2170550282C192562407 @default.
- W2170550282 hasConceptScore W2170550282C26873012 @default.
- W2170550282 hasConceptScore W2170550282C2777924906 @default.
- W2170550282 hasConceptScore W2170550282C2778413303 @default.
- W2170550282 hasConceptScore W2170550282C2779679103 @default.
- W2170550282 hasConceptScore W2170550282C2779892579 @default.
- W2170550282 hasConceptScore W2170550282C49040817 @default.
- W2170550282 hasConceptScore W2170550282C62520636 @default.
- W2170550282 hasConceptScore W2170550282C73500089 @default.
- W2170550282 hasConceptScore W2170550282C86803240 @default.
- W2170550282 hasIssue "7" @default.
- W2170550282 hasLocation W21705502821 @default.
- W2170550282 hasOpenAccess W2170550282 @default.
- W2170550282 hasPrimaryLocation W21705502821 @default.
- W2170550282 hasRelatedWork W1530744428 @default.
- W2170550282 hasRelatedWork W2016870653 @default.
- W2170550282 hasRelatedWork W2017387036 @default.
- W2170550282 hasRelatedWork W2031517912 @default.
- W2170550282 hasRelatedWork W2062379569 @default.
- W2170550282 hasRelatedWork W2071853817 @default.