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- W2170804784 abstract "X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials." @default.
- W2170804784 created "2016-06-24" @default.
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- W2170804784 creator A5067866773 @default.
- W2170804784 date "2007-11-01" @default.
- W2170804784 modified "2023-10-17" @default.
- W2170804784 title "Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis" @default.
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- W2170804784 doi "https://doi.org/10.1524/zkri.2007.222.11.567" @default.
- W2170804784 hasPublicationYear "2007" @default.
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