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- W2171574105 abstract "This paper examines the effectiveness of using the CrossCheck software tool CM-iTest to select high-fault coverage, robust test vectors for measuring I/sub DDQ/. In the experiments section of the paper data from 4 ASIC designs is presented which examines the defect detection of stuck-at fault (SAF) functional testing versus I/sub DDQ/ current testing for varying degrees of SAF and transistor-level I/sub DDQ/ fault coverages. The I/sub DDQ/ current testing further compares the defect detection of using CrossCheck CM-iTest selected I/sub DDQ/ vectors versus randomly selected and customer selected I/sub DDQ/ vectors." @default.
- W2171574105 created "2016-06-24" @default.
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- W2171574105 date "2002-11-19" @default.
- W2171574105 modified "2023-09-26" @default.
- W2171574105 title "Logic vs. current testing: an evaluation using CrossCheck Technology's CM-iTest" @default.
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- W2171574105 doi "https://doi.org/10.1109/asic.1995.580716" @default.
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