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• W2171769826 abstract "ZnO films with thickness of80 nm were grown by pulsed laser deposition (PLD) on MgO (1 0 0) single crys- tal and amorphous fused silica (FS) substrates. Structural studies of ZnO films and a high quality reference ZnO single crystal were performed by slow positron implantation spectroscopy (SPIS). It was found that ZnO films exhibit significantly higher density of defects than the reference ZnO crystal. Moreover, the ZnO film deposited on MgO substrate exhibits higher concentration of defects than the film deposited on amorphous FS substrate most probably due to a dense network of misfit dislocations. The ZnO films and the reference ZnO crystal were subsequently loaded with hydrogen by electrochemical cathodic charging. SPIS character- izations revealed that absorbed hydrogen introduces new defects into ZnO." @default.
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• W2171769826 date "2013-12-01" @default.
• W2171769826 modified "2023-10-18" @default.
• W2171769826 title "Hydrogen absorption in thin ZnO films prepared by pulsed laser deposition" @default.
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• W2171769826 doi "https://doi.org/10.1016/j.jallcom.2013.01.121" @default.
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