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• W2175312811 endingPage "1378" @default.
• W2175312811 startingPage "1372" @default.
• W2175312811 abstract "Effects of irradiation and annealing temperature on radiation-induced charge trapping are explored for MOS transistors. Transistors were irradiated with 10-keV X-rays at temperatures from -25 to 100/spl deg/C and annealed at 100/spl deg/C for times up to 3.6/spl times/10/sup 6/ s. Transistor data were analyzed for the contributions of radiation-induced charge due to oxide traps, border traps, and interface traps. Increased irradiation temperature resulted in increased interface-trap and border-trap buildup and decreased oxide-trapped charge buildup during irradiation. Interface-trap buildup immediately following irradiation for transistors irradiated at 100/spl deg/C was equivalent to the buildup of interface traps in transistors irradiated at 27/spl deg/C and annealed for one week at 100/spl deg/C (standard rebound test). For the p-channel transistors, a one-to-one correlation was observed between the increase in interface-trap charge and the decrease in oxide-trapped charge during irradiation. This may imply a link between increased interface-trap buildup and the annealing of oxide-trapped charge in these devices. The observed data can be-explained in terms of increased hydrogen ion transport rates to the Si/SiO/sub 2/ interface during elevated temperature irradiations. These results have implications on hardness assurance testing and potentially may be used to reduce costs associated with rebound qualification." @default.
• W2175312811 created "2016-06-24" @default.
• W2175312811 creator A5010472455 @default.
• W2175312811 creator A5011631892 @default.
• W2175312811 creator A5024133729 @default.
• W2175312811 creator A5083682498 @default.
• W2175312811 date "1998-06-01" @default.
• W2175312811 modified "2023-09-25" @default.
• W2175312811 title "Effects of irradiation temperature on MOS radiation response" @default.
• W2175312811 cites W1970351593 @default.
• W2175312811 cites W1972005006 @default.
• W2175312811 cites W1974315869 @default.
• W2175312811 cites W1982430840 @default.
• W2175312811 cites W2001021806 @default.
• W2175312811 cites W2007297276 @default.
• W2175312811 cites W2007602282 @default.
• W2175312811 cites W2007656209 @default.
• W2175312811 cites W2012364451 @default.
• W2175312811 cites W2021007263 @default.
• W2175312811 cites W2022574734 @default.
• W2175312811 cites W2029013246 @default.
• W2175312811 cites W2030301195 @default.
• W2175312811 cites W2051400932 @default.
• W2175312811 cites W2054857078 @default.
• W2175312811 cites W2054893389 @default.
• W2175312811 cites W2056267667 @default.
• W2175312811 cites W2074286565 @default.
• W2175312811 cites W2074301529 @default.
• W2175312811 cites W2078482863 @default.
• W2175312811 cites W2082931062 @default.
• W2175312811 cites W2087450899 @default.
• W2175312811 cites W2098356066 @default.
• W2175312811 cites W2115343518 @default.
• W2175312811 cites W2128171250 @default.
• W2175312811 cites W2135389588 @default.
• W2175312811 cites W2147080351 @default.
• W2175312811 cites W2148657785 @default.
• W2175312811 cites W2158390909 @default.
• W2175312811 doi "https://doi.org/10.1109/23.685209" @default.
• W2175312811 hasPublicationYear "1998" @default.
• W2175312811 type Work @default.
• W2175312811 sameAs 2175312811 @default.
• W2175312811 citedByCount "40" @default.
• W2175312811 countsByYear W21753128112013 @default.
• W2175312811 countsByYear W21753128112015 @default.
• W2175312811 countsByYear W21753128112016 @default.
• W2175312811 countsByYear W21753128112017 @default.
• W2175312811 countsByYear W21753128112018 @default.
• W2175312811 countsByYear W21753128112020 @default.
• W2175312811 countsByYear W21753128112021 @default.
• W2175312811 countsByYear W21753128112022 @default.
• W2175312811 countsByYear W21753128112023 @default.
• W2175312811 crossrefType "journal-article" @default.
• W2175312811 hasAuthorship W2175312811A5010472455 @default.
• W2175312811 hasAuthorship W2175312811A5011631892 @default.
• W2175312811 hasAuthorship W2175312811A5024133729 @default.
• W2175312811 hasAuthorship W2175312811A5083682498 @default.
• W2175312811 hasConcept C111337013 @default.
• W2175312811 hasConcept C113196181 @default.
• W2175312811 hasConcept C119599485 @default.
• W2175312811 hasConcept C121332964 @default.
• W2175312811 hasConcept C127413603 @default.
• W2175312811 hasConcept C159985019 @default.
• W2175312811 hasConcept C165801399 @default.
• W2175312811 hasConcept C172385210 @default.
• W2175312811 hasConcept C178790620 @default.
• W2175312811 hasConcept C184779094 @default.
• W2175312811 hasConcept C185544564 @default.
• W2175312811 hasConcept C185592680 @default.
• W2175312811 hasConcept C18903297 @default.
• W2175312811 hasConcept C191897082 @default.
• W2175312811 hasConcept C192562407 @default.
• W2175312811 hasConcept C2777855556 @default.
• W2175312811 hasConcept C2777924906 @default.
• W2175312811 hasConcept C2779851234 @default.
• W2175312811 hasConcept C36003996 @default.
• W2175312811 hasConcept C43617362 @default.
• W2175312811 hasConcept C49040817 @default.
• W2175312811 hasConcept C512968161 @default.
• W2175312811 hasConcept C86803240 @default.
• W2175312811 hasConceptScore W2175312811C111337013 @default.
• W2175312811 hasConceptScore W2175312811C113196181 @default.
• W2175312811 hasConceptScore W2175312811C119599485 @default.
• W2175312811 hasConceptScore W2175312811C121332964 @default.
• W2175312811 hasConceptScore W2175312811C127413603 @default.
• W2175312811 hasConceptScore W2175312811C159985019 @default.
• W2175312811 hasConceptScore W2175312811C165801399 @default.
• W2175312811 hasConceptScore W2175312811C172385210 @default.
• W2175312811 hasConceptScore W2175312811C178790620 @default.
• W2175312811 hasConceptScore W2175312811C184779094 @default.
• W2175312811 hasConceptScore W2175312811C185544564 @default.
• W2175312811 hasConceptScore W2175312811C185592680 @default.
• W2175312811 hasConceptScore W2175312811C18903297 @default.
• W2175312811 hasConceptScore W2175312811C191897082 @default.
• W2175312811 hasConceptScore W2175312811C192562407 @default.
• W2175312811 hasConceptScore W2175312811C2777855556 @default.
• W2175312811 hasConceptScore W2175312811C2777924906 @default.
• W2175312811 hasConceptScore W2175312811C2779851234 @default.

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