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- W2178799427 abstract "The maturation of low cost SOI MOSFET technology in the microwave domain has brought about a need to develop specific characterization techniques. An original scheme is presented, which, by combining careful design of probing and calibration structures, rigourous in situ calibration, and a new powerful direct extraction method, allows reliable identification of the parameters of the non--quasi--static small--signal model for MOSFET's. The extracted model is shown to be valid up to 40 GHz." @default.
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- W2178799427 date "1998-01-01" @default.
- W2178799427 modified "2023-09-26" @default.
- W2178799427 title "Accurate SOI MOSFET characterization at microwave frequencies" @default.
- W2178799427 hasPublicationYear "1998" @default.
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