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- W2182178685 abstract "This paper proposes a new simulation-based fault modeling methodology. The methodology - an extension of Inductive Fault Analysis - uses the contamination-defectfault simulator CODEF to directly relate effects of process-induced contamination to circuit-level malfunctions. The application of this methodology (called Inductive Contamination Analysis) is demonstrated by development of SRAM fault models." @default.
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- W2182178685 title "contamination Analysis (ICA) with SRA" @default.
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