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- W2183670408 abstract "This paper answers the frequently asked question, “How accurate are the approximate baseline long-and-widechannel MOS transistor models that have been used to develop the compact models for computer-aided circuit designs?” Three commonly used surface-potential-based (US=qZ S/kT) approximations of the bulk-charge are evaluated: QB v (i) (US) 1/2 , (ii) (USI 1) 1/2 , and (iii) [USI 1+exp(I US)] 1/2 . Self-consistent remote charge neutrality boundary condition, minority carriers, and space constant impurity concentration and oxide thickness are used. Percentage deviations of the approximations from the non-compact baseline model are computed for DC drain current, drain- and trans-conductances. Approximation (i) shows significant devia-tions, ~16% at threshold diverging rapidly with deepening into the subthreshold range. Approximations (ii) and (iii) show a few percent (1% to 2%) deviations in both inversion and subthreshold ranges, but diverge widely below sub-threshold and in accumulation. A new analytical model is tested and shows better than 10% accuracy in accumulation." @default.
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- W2183670408 date "2006-05-07" @default.
- W2183670408 modified "2023-09-24" @default.
- W2183670408 title "Accuracy of Surface-Potential-Based Long-Wide-Channel MOS Transistor Compact Models" @default.
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