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- W2184304657 abstract "Recent developments in the field of high intensity electron beams in the regime below 10 MeV, e.g. energy recovery linacs or magnetized high energy electron coolers, have led to special demands on the beam diagnostics. Since commonly used diagnostic tools like synchrotron radiation and scintillation screens are ineffective or not able to withstand the beam power without being damaged, new methods are needed. Hence, a beam profile measurement system based on beam induced fluorescence (BIF) was built. This quite simple system images the light generated by the interaction of the beam with the residual gas onto a PMT. A more elaborated system, the Thomson Laser Scanner (TLS) — the non-relativistic version of the Laser Wire Scanner — is proposed as a method for non-invasive measurement of all phase space components, especially in the injector and merger parts of an ERL. Both methods are implemented in a 100 keV photo gun." @default.
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- W2184304657 date "2013-01-01" @default.
- W2184304657 modified "2023-09-24" @default.
- W2184304657 title "BEAM PROFILE MEASUREMENT FOR HIGH INTENSITY ELECTRON BEAMS" @default.
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