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- W2185485793 abstract "Highfrequency devices aimedforpower applications cannot becharacterized byon-wafer measurements duetopowerdissipation constraints. Therefore characterization using testfixture isnecessary. Latest techniques applied toon- waferdevices usea four-port characterization oftheextrinsic networksurrounding thedevice. Nevertheless, thiscannotbe applied straightforwardly tothetest fixture caseduetothefact thatthegroundreference ofthedevice isnotthesameasthe measurement, andthiseffect increases withfrequency. A five- portdefinition wouldleadtoanaccurate characterization, but withtheincrease ofthecomplexity oftheproblem. Thispaper presents an alternative technique basedon four-port de- embedding technique withacorrection ofthelocal ground effect byusing twocold-FET measurements andasimplification ofthe four-port matrix model. Index Terms - Cold-FET, de-embedding, four-port network, microwave measurements, testfixture, Y-parameters" @default.
- W2185485793 created "2016-06-24" @default.
- W2185485793 creator A5007248799 @default.
- W2185485793 creator A5078918840 @default.
- W2185485793 date "2006-01-01" @default.
- W2185485793 modified "2023-09-27" @default.
- W2185485793 title "Four-port Deembedding Technique forFETDevices Mounted in Hybrid TestFixture" @default.
- W2185485793 cites W1879678483 @default.
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- W2185485793 hasPublicationYear "2006" @default.
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