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- W2187011161 abstract "Structure analysis technology using X-ray measurements and molecular dynamics (MD) simulations has been established for amorphous materials such as optical fiber glass and diamond-like carbon thin films. X-ray scattering measurements using highly brilliant X-ray from synchrotron radiation was found very effective to obtain scattering spectra with a high signal to background ratio, despite the extremely small quantities of specimen. X-ray absorption fine structure (XAFS) was employed to investigate the local structure around trace elements in the materials. The synchrotron radiation was also useful in this analysis, due to its wide range of X-ray energy. MD simulations using optimized Born-Mayer type two-body potentials were performed to build structure models for the amorphous materials. These technologies were applied for erbium (Er) doped SiO2 fibers (EDFs). The total and partial radial distribution functions from the MD simulations were found to reproduce the trends obtained by the X-ray experiments. In the EDF, aluminum (Al) is an effective co-dopant to improve the gain flatness as an optical amplifier. The structure analyses have clarified that the Al-doping expands the Er-O distance and increases the coordination number. The structure change is thought to lead to a variation in the electric field around Er 3+ and in the Stark levels" @default.
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- W2187011161 date "2008-01-01" @default.
- W2187011161 modified "2023-09-26" @default.
- W2187011161 title "Structure Analysis Technology for Amorphous Materials by Synchrotron Radiation X-ray Measurements and Molecular Dynamics Simulations" @default.
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