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- W2187395610 abstract "Abstract We examine the local structural and electrical properties of VO 2 films showing metal-to-insulator transition (MIT) by using in-situ x-ray absorption fine structure (XAFS) measurements at the V K edge and resistance measurements in the temperature range 20–120 °C. VO 2 films are synthesized on Al 2 O 3 (0001) substrates by DC magnetron sputtering deposition. X-ray diffraction measurements show that the films have b -oriented monoclinic-phase crystals at room temperature. XAFS measurements reveal a local structural transition in the films from the monoclinic (M 1 ) to the rutile (R) phase at ∼70 °C during their heating; further, temperature-dependent resistance (R–T) measurements showed a sharp MIT in the films at ∼75 °C. Extended XAFS (EXAFS) measurements reveal non-rigid changes of V–O and V–V bond lengths from the M 1 to the R phase via the M 2 phase. In-situ EXAFS and R–T measurements show that the synthesized VO 2 films act as Mott insulators and that their electrical property change is not proportional to their structural property change at their MIT temperature." @default.
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- W2187395610 date "2016-02-01" @default.
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- W2187395610 title "Synthesis and temperature-dependent local structural and electrical properties of VO2 films" @default.
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- W2187395610 doi "https://doi.org/10.1016/j.cap.2015.11.012" @default.
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