Matches in SemOpenAlex for { <https://semopenalex.org/work/W2189043944> ?p ?o ?g. }
- W2189043944 abstract "A new concept for full-wafer processing and test- ing for semiconductor laser fabrication in the AIGaAs-GaAs material system will be presented. The approach is based on chemically assisted ion beam etching for the laser-mirror for- mation. The technique routinely provides excellent mirror quality with mirror roughness of less than 200 A, resulting in mirror reflectivities of about 30% and scattering losses of less than 2%. Lasers with two etched mirrors have been fabricated that show equivalent output powerlcurrent (P/I) characteris- tics to lasers on the same wafer with both mirrors cleaved, up to more than 40 mW (CW) for uncoated mirrors. Single-mode operation exceeding 50 mW output power has been achieved for an SQW-GRINSCH ridge laser structure with coated, etched mirrors. Furthermore, the etching technique has been used to fabri- cate special devices and structures for on-wafer parametric laser and beam property characterization. This new approach to full-wafer testing allows efficient on-wafer functional testing of a large number of lasers on a 2-in wafer, with considerable improvement in testing throughput. The concept also incorpo- rates many test sites for process characterization which provide important feedback for process improvement/optimization. In addition to the above advantages of full-wafer processing and testing, the availability of high-quality etched mirrors will pro- vide the potential for lasers with specially shaped mirrors, and will open up new opportunities for opto-electronic integration. The approach described has been developed for lasers to be used in optical storage at wavelengths of 830 and 856 nm. How- ever, the basic concept can be applied to semiconductor laser fabrication in any other material system and wavelength range. The major difference will be the adaptation of the mirror-etch- ing process to the composition of the material." @default.
- W2189043944 created "2016-06-24" @default.
- W2189043944 creator A5002664201 @default.
- W2189043944 creator A5004280473 @default.
- W2189043944 creator A5008134176 @default.
- W2189043944 creator A5021674946 @default.
- W2189043944 creator A5030562008 @default.
- W2189043944 creator A5035639074 @default.
- W2189043944 creator A5048730380 @default.
- W2189043944 creator A5050914877 @default.
- W2189043944 creator A5053177533 @default.
- W2189043944 creator A5062918668 @default.
- W2189043944 creator A5069721086 @default.
- W2189043944 creator A5085571285 @default.
- W2189043944 date "1991-01-01" @default.
- W2189043944 modified "2023-10-17" @default.
- W2189043944 title "Special Issue Papers Full-Wafer Technology-A New Approach to Large-scale Laser Fabrication and Integration" @default.
- W2189043944 cites W1965805757 @default.
- W2189043944 cites W1967577783 @default.
- W2189043944 cites W1978636256 @default.
- W2189043944 cites W1981050040 @default.
- W2189043944 cites W1981611259 @default.
- W2189043944 cites W1991920643 @default.
- W2189043944 cites W2000419504 @default.
- W2189043944 cites W2004961634 @default.
- W2189043944 cites W2015173650 @default.
- W2189043944 cites W2024919304 @default.
- W2189043944 cites W2030243685 @default.
- W2189043944 cites W2035275556 @default.
- W2189043944 cites W2038850364 @default.
- W2189043944 cites W2059001329 @default.
- W2189043944 cites W2064963707 @default.
- W2189043944 cites W2065469270 @default.
- W2189043944 cites W2069022184 @default.
- W2189043944 cites W2076262017 @default.
- W2189043944 cites W2078247447 @default.
- W2189043944 cites W2089838331 @default.
- W2189043944 cites W2094158064 @default.
- W2189043944 cites W2137246323 @default.
- W2189043944 cites W2165856397 @default.
- W2189043944 cites W2169093541 @default.
- W2189043944 cites W2328243515 @default.
- W2189043944 cites W2798950047 @default.
- W2189043944 hasPublicationYear "1991" @default.
- W2189043944 type Work @default.
- W2189043944 sameAs 2189043944 @default.
- W2189043944 citedByCount "0" @default.
- W2189043944 crossrefType "journal-article" @default.
- W2189043944 hasAuthorship W2189043944A5002664201 @default.
- W2189043944 hasAuthorship W2189043944A5004280473 @default.
- W2189043944 hasAuthorship W2189043944A5008134176 @default.
- W2189043944 hasAuthorship W2189043944A5021674946 @default.
- W2189043944 hasAuthorship W2189043944A5030562008 @default.
- W2189043944 hasAuthorship W2189043944A5035639074 @default.
- W2189043944 hasAuthorship W2189043944A5048730380 @default.
- W2189043944 hasAuthorship W2189043944A5050914877 @default.
- W2189043944 hasAuthorship W2189043944A5053177533 @default.
- W2189043944 hasAuthorship W2189043944A5062918668 @default.
- W2189043944 hasAuthorship W2189043944A5069721086 @default.
- W2189043944 hasAuthorship W2189043944A5085571285 @default.
- W2189043944 hasConcept C100460472 @default.
- W2189043944 hasConcept C108225325 @default.
- W2189043944 hasConcept C120665830 @default.
- W2189043944 hasConcept C121332964 @default.
- W2189043944 hasConcept C121477167 @default.
- W2189043944 hasConcept C136525101 @default.
- W2189043944 hasConcept C142724271 @default.
- W2189043944 hasConcept C160671074 @default.
- W2189043944 hasConcept C171250308 @default.
- W2189043944 hasConcept C192562407 @default.
- W2189043944 hasConcept C204787440 @default.
- W2189043944 hasConcept C2779227376 @default.
- W2189043944 hasConcept C49040817 @default.
- W2189043944 hasConcept C520434653 @default.
- W2189043944 hasConcept C71924100 @default.
- W2189043944 hasConceptScore W2189043944C100460472 @default.
- W2189043944 hasConceptScore W2189043944C108225325 @default.
- W2189043944 hasConceptScore W2189043944C120665830 @default.
- W2189043944 hasConceptScore W2189043944C121332964 @default.
- W2189043944 hasConceptScore W2189043944C121477167 @default.
- W2189043944 hasConceptScore W2189043944C136525101 @default.
- W2189043944 hasConceptScore W2189043944C142724271 @default.
- W2189043944 hasConceptScore W2189043944C160671074 @default.
- W2189043944 hasConceptScore W2189043944C171250308 @default.
- W2189043944 hasConceptScore W2189043944C192562407 @default.
- W2189043944 hasConceptScore W2189043944C204787440 @default.
- W2189043944 hasConceptScore W2189043944C2779227376 @default.
- W2189043944 hasConceptScore W2189043944C49040817 @default.
- W2189043944 hasConceptScore W2189043944C520434653 @default.
- W2189043944 hasConceptScore W2189043944C71924100 @default.
- W2189043944 hasLocation W21890439441 @default.
- W2189043944 hasOpenAccess W2189043944 @default.
- W2189043944 hasPrimaryLocation W21890439441 @default.
- W2189043944 hasRelatedWork W143304931 @default.
- W2189043944 hasRelatedWork W1844722597 @default.
- W2189043944 hasRelatedWork W1857206108 @default.
- W2189043944 hasRelatedWork W1969831794 @default.
- W2189043944 hasRelatedWork W1985761500 @default.
- W2189043944 hasRelatedWork W1992293743 @default.
- W2189043944 hasRelatedWork W2002414061 @default.