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- W2220244595 abstract "A technique is described which can be applied to the testing of circuits containing both analogue and digital components. The approach is based on transient response techniques, and uses digital-like test vectors. The technique is compared with current testing techniques for mixed signal devices and is shown to have certain advantages over these other techniques. Experimental results based on a simple mixed signal circuit are presented, and reasonable fault coverage with minimal testing effort is demonstrated." @default.
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- W2220244595 date "1990-11-15" @default.
- W2220244595 modified "2023-09-23" @default.
- W2220244595 title "Testing mixed signal integrated circuits" @default.
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