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- W2225127524 abstract "Linearly graded InxGa1−xAs metamorphic buffers with different mismatch grading rates were grown on InP substrate by gas source molecular beam epitaxy. Room temperature photoluminescence spectra show that the sample with lower mismatch grading rate in the buffer has stronger photoluminescence signal, indicating the improved optical property. Atomic force microscope images show that the lower mismatch grading rate in the buffer leads to a slightly rougher surface. The relaxation procedure with two steps in the buffer layers has been observed by X-ray diffraction reciprocal space mapping. The measurements of X-ray diffraction also reveal that the lower mismatch grading rate in the buffer is beneficial for the lattice relaxation and release of residual strain. To further increase the relaxation degree, a lower mismatch grading rate and composition overshoot are suggested." @default.
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- W2225127524 date "2013-07-01" @default.
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- W2225127524 title "InP-based InxGa1−xAs metamorphic buffers with different mismatch grading rates" @default.
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- W2225127524 doi "https://doi.org/10.1088/1674-4926/34/7/073005" @default.
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