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- W2283802021 abstract "We present measurements of thermal and electrical conductivity of polycrystalline permalloy (Ni-Fe), aluminum, copper, cobalt, and nickel thin films with thickness $l200$ nm. A micromachined silicon-nitride membrane thermal-isolation platform allows measurements of both transport properties on a single film and an accurate probe of the Wiedemann--Franz (WF) law expected to relate the two. Through careful elimination of possible effects of surface scattering of phonons in the supporting membrane, we find excellent agreement with WF in a thin Ni-Fe film over nearly the entire temperature range from 77 to 325 K. All other materials studied here deviate somewhat from the WF prediction of electronic thermal conductivity with a Lorenz number, $L$, suppressed from the free-electron value by $10%phantom{rule{4.pt}{0ex}}text{to}phantom{rule{4.pt}{0ex}}20%$. For Al and Cu we compare the results to predictions of the theoretical expression for the Lorenz number as a function of $T$. This comparison indicates two different types of deviation from expected behavior. In the Cu film, a higher than expected $L$ at lower $T$ indicates an additional thermal conduction mechanism, while at higher $T$ lower than expected values suggests an additional inelastic scattering mechanism for electrons. We suggest the additional low-$Tphantom{rule{4pt}{0ex}}L$ indicates a phonon contribution to thermal conductivity and consider increased electron-phonon scattering at grain boundaries or surfaces to explain the high-$T$ reduction in $L$." @default.
- W2283802021 created "2016-06-24" @default.
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- W2283802021 date "2015-12-08" @default.
- W2283802021 modified "2023-10-15" @default.
- W2283802021 title "Thermal and electrical conductivity of approximately 100-nm permalloy, Ni, Co, Al, and Cu films and examination of the Wiedemann-Franz Law" @default.
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- W2283802021 doi "https://doi.org/10.1103/physrevb.92.214410" @default.
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