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- W2286422665 abstract "This paper reports the results of high-precision energy yield measurements of different PV module technologies performed at the headquarters of TUV Rheinland, Cologne, from May 2010 through April 2011. The investigations refer to 12 specimens each subjected to a separate electronic load for automated MPP tracking and V/Icurve measurements. Modules based on CdTe, CI(G)S, a-Si, a-Si/μ-Si, a-Si/a-Si and c-Si (mono and poly) semiconductors were analyzed and compared in a ranking with regard to the achieved specific energy yield. We consider the individual reasons for differences in performance, such as low irradiance behaviour, temperature coefficients, spectral irradiance effects and meta-instabilities of nominal power output, and describe the challenges in gathering high resolution measurement data." @default.
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- W2286422665 date "2011-10-10" @default.
- W2286422665 modified "2023-09-23" @default.
- W2286422665 title "Factors Affecting the Performance of Different Thin-Film PV Technologies and Their Impact on the Energy Yield" @default.
- W2286422665 doi "https://doi.org/10.4229/26theupvsec2011-4av.2.56" @default.
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