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• W2288509986 startingPage "1732" @default.
• W2288509986 abstract "The room temperature growth of highly <111> oriented sputtered NiO thin films on glass and silicon substrates previously covered with a <111> oriented Cu2O film is reported. The results are compared to those obtained from single layer NiO thin films using the same deposition conditions. Electron microdiffraction analyses indicate that NiO columns are heteroepitaxially grown on the columns of a Cu2O seed layer. The well-matched atomic configurations between the Cu atoms in the {111} planes of Cu2O and the O atoms in the {111} planes of NiO may provide a strong driving force to promote this local heteroepitaxial growth. Such heteroepitaxial growth behavior in the columns can significantly improve crystallization. Moreover, valence electron energy loss spectroscopy has been employed to investigate the interband transition properties of the NiO films, which shows that the interband transition intensity can be tuned by this local heteroepitaxial growth." @default.
• W2288509986 created "2016-06-24" @default.
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• W2288509986 date "2016-01-01" @default.
• W2288509986 modified "2023-10-08" @default.
• W2288509986 title "Local heteroepitaxial growth to promote the selective growth orientation, crystallization and interband transition of sputtered NiO thin films" @default.
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• W2288509986 doi "https://doi.org/10.1039/c5ce02419f" @default.
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