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- W2289920462 abstract "Conventional purely electronic measurement instruments such as vector network analyzers, spectrum analyzers and sampling oscilloscopes are not effective at above 100 GHz. One major limitation is imposed by the connectors and waveguides needed for signal coupling between the test instrument and the device under test. To overcome those limitations of present measurement techniques, we have developed a photoconductive probe sampling technique which can be applied to the measurement of S-parameters of mm- wave circuit components with a 120-GHz measurement bandwidth [1]. The photoconductive probe sampling technique combines the ultrafast optical technology of 120-fs Ti-Sapphire short pulse laser [2] and microfabrication technology of Silicon-On-Sapphire (SOS) photoconductive sampling probe, which consists of a high-impedance interdigitated photoconductive switch. The probe technology has demonstrated a 2.1 ps temporal resolution and low-invasiveness making this very attractive for external circuit testing of mm-wave circuits with a 120-GHz measurement bandwidth." @default.
- W2289920462 created "2016-06-24" @default.
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- W2289920462 date "1993-01-01" @default.
- W2289920462 modified "2023-09-27" @default.
- W2289920462 title "120-GHz-Bandwidth Characterization of Microwave Passive Devices Using External Silicon-On-Sapphire Photoconductive Sampling Probe" @default.
- W2289920462 cites W2052358360 @default.
- W2289920462 doi "https://doi.org/10.1364/ueo.1993.i4" @default.
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