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• W2294923835 abstract "Edge illumination (EI) X-ray phase-contrast imaging has great potential for applications in a wide range of research, industrial and clinical fields. The optimization of the EI experimental setup for a given application is therefore essential, in order to take full advantage of the capabilities of the technique. In this work, we analyze the dependence of the angular sensitivity, spatial resolution and dose delivered to the sample upon the various experimental parameters, and describe possible strategies to optimize them. The obtained results will be important for the design of future EI experimental setups, in particular enabling their tailoring to specific applications." @default.
• W2294923835 created "2016-06-24" @default.
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• W2294923835 date "2014-11-01" @default.
• W2294923835 modified "2023-10-16" @default.
• W2294923835 title "Optimization of sensitivity, dose and spatial resolution in edge illumination X-ray phase-contrast imaging" @default.
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• W2294923835 doi "https://doi.org/10.1109/nssmic.2014.7430970" @default.
• W2294923835 hasPublicationYear "2014" @default.
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