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- W2300924175 abstract "Abstract : This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions." @default.
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- W2300924175 date "1982-01-01" @default.
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- W2300924175 title "Microcircuit Device Reliability Memory/Digital LSI" @default.
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