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- W2301049332 abstract "We have calculated the van der Waals force between two different, semi-infinite dielectric media, separated by a region of vacuum of nominal thickness $l$, when the surface of one of the two media is rough. The calculation is carried out by the method of van Kampen, Nijboer, and Schram [Phys. Lett. 26A, 307 (1968)] to yield the force at the absolute zero of temperature in the regime $lensuremath{ll}ensuremath{lambda}$, where $ensuremath{lambda}$ is the smaller of the principal absorption wavelengths of the two dielectric media. The result obtained has the form $f(l)=ensuremath{-}frac{{C}_{3}}{{(frac{l}{a})}^{3}}ensuremath{-}frac{{ensuremath{delta}}^{2}}{{a}^{2}}left(frac{{C}_{4}}{{(frac{l}{a})}^{4}}+frac{{C}_{5}}{{(frac{l}{a})}^{5}}+ensuremath{cdots}right)+Oleft(frac{{ensuremath{delta}}^{4}}{{a}^{4}}right)$ in the limit $frac{l}{a}$ is large. Here $a$ is the transverse correlation length, the mean distance between consecutive peaks and valleys on the rough surface, while $ensuremath{delta}$ is the root-mean-square departure of the surface from flatness. Explicit expressions have been obtained for the coefficients ${C}_{4}$ and ${C}_{5}$, and numerical estimates of the magnitude of the roughness-induced contribution to the van der Waals force are obtained in the case that the two media are the same, and their common dielectric constant is given by $ensuremath{epsilon}(ensuremath{omega})=1ensuremath{-}(frac{{{ensuremath{omega}}_{p}}^{2}}{{ensuremath{omega}}^{2}})$, where ${ensuremath{omega}}_{p}$ is a plasma frequency. It is found that surface roughness increases the magnitude of the van der Waals force over its value when the surfaces of both media are flat." @default.
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- W2301049332 date "1980-08-15" @default.
- W2301049332 modified "2023-09-26" @default.
- W2301049332 title "Effects of surface roughness on the van der Waals force between macroscopic bodies" @default.
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- W2301049332 doi "https://doi.org/10.1103/physrevb.22.1677" @default.
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