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- W2302495524 abstract "A system for the acquisition of real-time failure data has been designed for in-situ total ionizing dose testing of large-scale integrated circuits. System selection considerations are discussed. Data acquisition and analysis features are described using the Intel MCS-51 microcontroller family as an example." @default.
- W2302495524 created "2016-06-24" @default.
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- W2302495524 date "1984-04-01" @default.
- W2302495524 modified "2023-09-26" @default.
- W2302495524 title "Automatic testing of microprocessors in radiation environments" @default.
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