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- W2305517087 abstract "In this work an X band Build In Test Equipment (BITE), implemented in the SiGe BiCMOS technology of Infineon, is presented. The possibility to perform precise measurements of phase shift and gain in the X- band, using lower frequency ( 4GHz-6GHz) automated test equipment (ATE), which is also used in WLAN devices, is investigated, leading to the design of the complete test equipment and finally to the full custom layout design" @default.
- W2305517087 created "2016-06-24" @default.
- W2305517087 creator A5066306966 @default.
- W2305517087 date "2014-04-15" @default.
- W2305517087 modified "2023-10-16" @default.
- W2305517087 title "Design of a Built-In Test Equipment for a X-band phased array radar system in SiGe BiCMOS technology" @default.
- W2305517087 hasPublicationYear "2014" @default.
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